Astm F 1260M – 96 (Reapproved 2003) Pdf free download

Standard Test Method
for Estimating Electromigration Median Time-To-Failure and
Sigma of Integrated Circuit Metallizations [Metric]1

This standard is issued under the fixed designation F 1260M; the number immediately following the designation indicates the year of
original adoption or, in the case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. A
superscript epsilon (e) indicates an editorial change since the last revision or reapproval.